Combinatorial deposition of thin film materials libraries

The advantage of a combinatorial approach

In materials science, one is often faced with the problem of optimizing a materials property by tuning its composition. Traditionally, composition-property relationships are investigated by sequential synthesis of multiple samples that each have a distinct composition, requiring a lot of time and effort.

thumbnailCombinatorialAn example of a combinatorial gradient. 

In our home-built combinatorial deposition systems, we can deposit thin films with a continuous compositional gradient. In this way, a single deposition experiment results in the availability of a thin film combinatorial library, which is in fact a binary or ternary phase diagram that is printed as a thin film onto a planar substrate. 

Optimised characterisation methods

After deposition of such a thin film combinatorial library, the properties of interest can be evaluated as a function of position within the library, and hence as a function of composition of the deposited material. Through the availability of mapping stages on several characterization tools, our lab is well equiped for this task:

  • Compositional analysis by mapping XRF or EDX
  • Crystalline structure analysis by mapping XRD
  • Morphology by mapping SEM or AFM
  • Optical characterization by spectroscopic ellipsometry mapping
  • Electrical characterisation by IV/CV and four-point probing
© 2012-2015 CoCoon Research Department (works with IE7, firefox 3 or better). Drupal theme by Kiwi Themes.