Journal papers

Found 191 results
[ Author(Desc)] Title Type Year
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D
Defect characterization of the structure-growth zone-model for sputter deposited Cu films, De Baerdemaeker, J., Dauwe C., Segers D., Detavernier Christophe, Deduytsche D., Egger W., and Sperr P. , Icotom 14: Textures of Materials, Pts 1and 2, Volume 445-6, p.69-71, (2004)
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100), De Keyser, K., Van Bockstael C., Vanmeirhaeghe R. L., Detavernier Christophe, Verleysen E., Bender H., Vandervorst W., Jordan-Sweet J. L., and Lavoie C. , Applied Physics Letters, Apr 26, Volume 96, Number 17, p.-, (2010)
Texture of Cobalt Germanides on Ge(100) and Ge(111) and Its Influence on the Formation Temperature, De Keyser, K., Vanmeirhaeghe R. L., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Journal of the Electrochemical Society, Volume 157, Number 4, p.H395-H404, (2010)
Epitaxial formation of a metastable hexagonal nickel-silicide, De Keyser, K., Van Bockstael C., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Electrochemical and Solid State Letters, Volume 11, Number 9, p.H266-H268, (2008)
Characterization of the texture of silicide films using electron backscattered diffraction, De Keyser, K., Detavernier Christophe, and Vanmeirhaeghe R. L. , Applied Physics Letters, Mar 19, Volume 90, Number 12, p.-, (2007)
Phase formation and texture of nickel silicides on Si1-xCx epilayers, De Keyser, K., De Schutter B., Detavernier Christophe, Machkaoutsan V., Bauer M., Thomas S. G., Jordan-Sweet J. L., and Lavoie C. , Microelectronic Engineering, May, Volume 88, Number 5, p.536-540, (2011)
THE TEXTURE OF THIN NiSi FILMS AND ITS EFFECT ON AGGLOMERATION, De Keyser, K., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Applications of Texture Analysis, Volume 201, p.3-10818, (2009)
Texture of CoSi2 films on Si(111), (110) and (001) substrates, De Keyser, K., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Thin Solid Films, Dec 1, Volume 519, Number 4, p.1277-1284, (2010)
Visualization and classification of epitaxial alignment at hetero-phase boundaries, De Schutter, B., De Keyser K., and Detavernier C. , Thin Solid Films, Jan-12-2015, (2015)
Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111), De Schutter, B., van Stiphout K., Santos N. M., Bladt E., Jordan-Sweet J., Bals S., Lavoie C., Comrie C. M., Vantomme A., and Detavernier C. , Journal of Applied Physics, Volume 119, (2016)
Phase formation in intermixed Ni–Ge thin films: Influence of Ge content and low-temperature nucleation of hexagonal nickel germanides, De Schutter, B., Devulder W., Schrauwen A., van Stiphout K., Perkisas T., Bals S., Vantomme A., and Detavernier C. , Microelectronic Engineering, Jan-05-2014, Volume 120, p.168 - 173, (2014)
Texture in thin film silicides and germanides: A review, De Schutter, B., De Keyser K., Lavoie C., and Detavernier C. , Applied Physics Reviews, Volume 3, (2016)
Formation and stability of NiSi in the presence of Co and Fe alloying elements, Deduytsche, D., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Journal of Vacuum Science & Technology B, Nov, Volume 26, Number 6, p.1971-1977, (2008)
Formation and morphological stability of NiSi in the presence of W, Ti, and Ta alloying elements, Deduytsche, D., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Journal of Applied Physics, Feb 15, Volume 101, Number 4, p.-, (2007)
High-temperature degradation of NiSi films: Agglomeration versus NiSi2 nucleation, Deduytsche, D., Detavernier Christophe, Vanmeirhaeghe R. L., and Lavoie C. , Journal of Applied Physics, Aug 1, Volume 98, Number 3, p.-, (2005)
The influence of Pt redistribution on Ni1-xPtxSi growth properties, Demeulemeester, J., Smeets D., Comrie C. M., Van Bockstael C., Knaepen W., Detavernier Christophe, Temst K., and Vantomme A. , Journal of Applied Physics, Aug 15, Volume 108, Number 4, p.-, (2010)
Pt redistribution during Ni(Pt) silicide formation, Demeulemeester, J., Smeets D., Van Bockstael C., Detavernier Christophe, Comrie C. M., Barradas N. P., Vieira A., and Vantomme A. , Applied Physics Letters, Dec 29, Volume 93, Number 26, p.-, (2008)
Modeling the Conformality of Atomic Layer Deposition: The Effect of Sticking Probability, Dendooven, J., Deduytsche D., Musschoot J., Vanmeirhaeghe R. L., and Detavernier Christophe , Journal of the Electrochemical Society, Volume 156, Number 4, p.P63-P67, (2009)
In Situ Monitoring of Atomic Layer Deposition in Nanoporous Thin Films Using Ellipsometric Porosimetry, Dendooven, Jolien, Devloo-Casier Kilian, Levrau Elisabeth, Van Hove Robbert, Sree Sreeprasanth Pulinthanathu, Baklanov Mikhail R., Martens Johan A., and Detavernier Christophe , Langmuir, 02/2012, Volume 28, Issue 8, p.3852 - 3859, (2012)
Tuning the Pore Size of Ink-Bottle Mesopores by Atomic Layer Deposition, Dendooven, Jolien, Goris Bart, Devloo-Casier Kilian, Levrau Elisabeth, Biermans Ellen, Baklanov Mikhail R., Ludwig Karl F., Voort Pascal Van Der, Bals Sara, and Detavernier Christophe , Chemistry of Materials, 06/2012, Volume 24, Issue 11, p.1992 - 1994, (2012)

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