Journal papers

Found 6 results
Author Title [ Type(Desc)] Year
Filters: Keyword is thin films  [Clear All Filters]
Journal Article
A BEEM study of the temperature dependence of the barrier height distribution in PtSi/n-Si Schottky diodes, Zhu, S., Vanmeirhaeghe R. L., Detavernier Christophe, Ru G. P., Li B. Z., and Cardon F. , Solid State Communications, Volume 112, Number 11, p.611-615, (1999)
Combinatorial Study of Ag-Te Thin Films and Their Application as Cation Supply Layer in CBRAM Cells, Devulder, Wouter, Opsomer Karl, Meersschaut Johan, Deduytsche Davy, Jurczak Malgorzata, Goux Ludovic, and Detavernier Christophe , ACS COMBINATORIAL SCIENCE, 05/2015, Volume 17, p.334-340, (2015)
Modeling the Conformality of Atomic Layer Deposition: The Effect of Sticking Probability, Dendooven, J., Deduytsche D., Musschoot J., Vanmeirhaeghe R. L., and Detavernier Christophe , Journal of the Electrochemical Society, Volume 156, Number 4, p.P63-P67, (2009)
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100), De Keyser, K., Van Bockstael C., Vanmeirhaeghe R. L., Detavernier Christophe, Verleysen E., Bender H., Vandervorst W., Jordan-Sweet J. L., and Lavoie C. , Applied Physics Letters, Apr 26, Volume 96, Number 17, p.-, (2010)
Pt redistribution during Ni(Pt) silicide formation, Demeulemeester, J., Smeets D., Van Bockstael C., Detavernier Christophe, Comrie C. M., Barradas N. P., Vieira A., and Vantomme A. , Applied Physics Letters, Dec 29, Volume 93, Number 26, p.-, (2008)
Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots, Smeets, D., Demeulemeester J., Deduytsche D., Detavernier Christophe, Comrie C. M., Theron C. C., Lavoie C., and Vantomme A. , Journal of Applied Physics, Nov 15, Volume 104, Number 10, p.-, (2008)
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