Journal papers

Found 23 results
Author Title Type [ Year(Asc)]
Filters: Author is Sweet, JJ  [Clear All Filters]
2010
In situ study of the formation of silicide phases in amorphous Co-Si mixed layers, Van Bockstael, C., De Keyser K., Demeulemeester J., Vantomme A., Vanmeirhaeghe R. L., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Microelectronic Engineering, Mar, Volume 87, Number 3, p.282-285, (2010)
In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100), Knaepen, W., Demeulemeester J., Jordan-Sweet J. L., Vantomme A., Detavernier Christophe, Vanmeirhaeghe R. L., and Lavoie C. , Journal of Vacuum Science & Technology A, Jan, Volume 28, Number 1, p.20-26, (2010)
In situ X-ray diffraction study of thin film Ir/Si solid state reactions, Knaepen, W., Demeulemeester J., Deduytsche D., Jordan-Sweet J. L., Vantomme A., Vanmeirhaeghe R. L., Detavernier Christophe, and Lavoie C. , Microelectronic Engineering, Mar, Volume 87, Number 3, p.258-262, (2010)
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100), De Keyser, K., Van Bockstael C., Vanmeirhaeghe R. L., Detavernier Christophe, Verleysen E., Bender H., Vandervorst W., Jordan-Sweet J. L., and Lavoie C. , Applied Physics Letters, Apr 26, Volume 96, Number 17, p.-, (2010)
Texture of Cobalt Germanides on Ge(100) and Ge(111) and Its Influence on the Formation Temperature, De Keyser, K., Vanmeirhaeghe R. L., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Journal of the Electrochemical Society, Volume 157, Number 4, p.H395-H404, (2010)
Texture of CoSi2 films on Si(111), (110) and (001) substrates, De Keyser, K., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Thin Solid Films, Dec 1, Volume 519, Number 4, p.1277-1284, (2010)
2004
Axiotaxy of CoSi2 thin films on Si(100) substrates and the effects of Ti alloying, Ozcan, A. S., Ludwig KF, Detavernier Christophe, Lavoie C., and Jordan-Sweet J. L. , Journal of Applied Physics, Jun 15, Volume 95, Number 12, p.8376-8381, (2004)
Texture of tetragonal alpha-FeSi2 films on Si(001), Detavernier, Christophe, Lavoie C., Jordan-Sweet J. L., and Ozcan A. S. , Physical Review BPhysical Review B, May, Volume 69, Number 17, p.-, (2004)
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