Journal papers

Found 43 results
Author Title Type [ Year(Asc)]
Filters: Author is C Lavoie  [Clear All Filters]
2010
In situ study of the formation of silicide phases in amorphous Co-Si mixed layers, Van Bockstael, C., De Keyser K., Demeulemeester J., Vantomme A., Vanmeirhaeghe R. L., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Microelectronic Engineering, Mar, Volume 87, Number 3, p.282-285, (2010)
In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100), Knaepen, W., Demeulemeester J., Jordan-Sweet J. L., Vantomme A., Detavernier Christophe, Vanmeirhaeghe R. L., and Lavoie C. , Journal of Vacuum Science & Technology A, Jan, Volume 28, Number 1, p.20-26, (2010)
In situ X-ray diffraction study of thin film Ir/Si solid state reactions, Knaepen, W., Demeulemeester J., Deduytsche D., Jordan-Sweet J. L., Vantomme A., Vanmeirhaeghe R. L., Detavernier Christophe, and Lavoie C. , Microelectronic Engineering, Mar, Volume 87, Number 3, p.258-262, (2010)
Phase formation and thermal stability of ultrathin nickel-silicides on Si(100), De Keyser, K., Van Bockstael C., Vanmeirhaeghe R. L., Detavernier Christophe, Verleysen E., Bender H., Vandervorst W., Jordan-Sweet J. L., and Lavoie C. , Applied Physics Letters, Apr 26, Volume 96, Number 17, p.-, (2010)
Texture of Cobalt Germanides on Ge(100) and Ge(111) and Its Influence on the Formation Temperature, De Keyser, K., Vanmeirhaeghe R. L., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Journal of the Electrochemical Society, Volume 157, Number 4, p.H395-H404, (2010)
Texture of CoSi2 films on Si(111), (110) and (001) substrates, De Keyser, K., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Thin Solid Films, Dec 1, Volume 519, Number 4, p.1277-1284, (2010)
2008
Effect of Pt addition on growth stress and thermal stress of NiSi films, Van Bockstael, C., De Keyser K., Deduytsche D., Vanmeirhaeghe R. L., Detavernier Christophe, Jordan-Sweet J. L., and Lavoie C. , Journal of Applied Physics, Sep 1, Volume 104, Number 5, p.-, (2008)
Epitaxial formation of a metastable hexagonal nickel-silicide, De Keyser, K., Van Bockstael C., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Electrochemical and Solid State Letters, Volume 11, Number 9, p.H266-H268, (2008)
Formation and stability of NiSi in the presence of Co and Fe alloying elements, Deduytsche, D., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Journal of Vacuum Science & Technology B, Nov, Volume 26, Number 6, p.1971-1977, (2008)
In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon, Knaepen, W., Detavernier Christophe, Vanmeirhaeghe R. L., Jordan-Sweet J. L., and Lavoie C. , Thin Solid Films, Jun 2, Volume 516, Number 15, p.4946-4952, (2008)
Nucleation and diffusion during growth of ternary Co1-xNixSi2 thin films studied by complementary techniques in real time, Smeets, D., Demeulemeester J., De Keyser K., Deduytsche D., Detavernier Christophe, Comrie C. M., Theron C. C., Lavoie C., and Vantomme A. , Journal of Applied Physics, Nov 1, Volume 104, Number 9, p.-, (2008)
The role of lattice mismatch and kinetics in texture development: Co1-xNixSi2 thin films on Si(100), Smeets, D., Vantomme A., De Keyser K., Detavernier Christophe, and Lavoie C. , Journal of Applied Physics, Mar 15, Volume 103, Number 6, p.-, (2008)
Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots, Smeets, D., Demeulemeester J., Deduytsche D., Detavernier Christophe, Comrie C. M., Theron C. C., Lavoie C., and Vantomme A. , Journal of Applied Physics, Nov 15, Volume 104, Number 10, p.-, (2008)
Texture of NiSi films on Si(001), (111), and (110) substrates, Detavernier, Christophe, Jordan-Sweet J. L., and Lavoie C. , Journal of Applied Physics, Jun 1, Volume 103, Number 11, p.-, (2008)

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